Texas Instruments 74LVTH182646APMG4 Misc logica e timing

Scan Test Device -40°C to 85°C 64-Pin LQFP Tray

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74LVTH182646APMG4

74LVTH182646APMG4 Texas Instruments

Texas Instruments74LVTH182646APMG4Misc logica e timing

Scan Test Device -40°C to 85°C 64-Pin LQFP Tray

A datasheet is only available for this product at this time.