Texas Instruments SN74ABT8245DWG4 Misc logica e timing

Scan Test Device -40°C to 85°C 24-Pin SOIC Tube

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Texas InstrumentsSN74ABT8245DWG4Misc logica e timing

Scan Test Device -40°C to 85°C 24-Pin SOIC Tube

A datasheet is only available for this product at this time.