Texas Instruments Logic and Timing Misc
부품 번호 | Price | 주식 | Manufacturer | Category | Rad Hard | Pin Count | Supplier Package | Standard Package Name | CECC Qualified | ESD Protection | Military | AEC Qualified | Auto motive | P PAP | ECCN Code | SVHC | SVHC Exceeds Threshold |
---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
74LVTH182646APMG4 Scan Test Device -40°C to 85°C 64-Pin LQFP Tray |
|
Texas Instruments | Logic and Timing Misc | 64 | LQFP | QFP | No | No | No | No | No | Yes | No | ||||
74LVTH182512DGGRE4 Scan Test Device -40°C to 85°C 64-Pin TSSOP T/R |
|
Texas Instruments | Logic and Timing Misc | 64 | TSSOP | SO | No | No | No | No | No | Yes | No | ||||
CD40117BMT Terminator -55°C to 125°C 14-Pin SOIC T/R |
|
Texas Instruments | Logic and Timing Misc | 14 | SOIC | SO | No | No | No | No | No | Yes | No | ||||
CD40117BMTG4 Terminator -55°C to 125°C 14-Pin SOIC T/R |
|
Texas Instruments | Logic and Timing Misc | 14 | SOIC | SO | No | No | No | No | No | Yes | No | ||||
CD4521BMT Frequency Divider -55°C to 125°C 16-Pin SOIC T/R |
|
Texas Instruments | Logic and Timing Misc | No | 16 | SOIC | SO | No | No | No | No | No | EAR99 | No | No | ||
CD4521BMTE4 CMOS 24-Stage frequency divider |
|
Texas Instruments | Logic and Timing Misc | 16 | SOIC | SO | No | No | No | No | No | Yes | No | ||||
5962-9458601QXA Scan Test Device -55°C to 125°C 28-Pin CDIP Tube |
|
Texas Instruments | Logic and Timing Misc | No | 28 | CDIP | DIP | No | Yes | No | No | No | EAR99 | Yes | Yes | ||
5962-9461601QXA Scan Test Device -55°C to 125°C 28-Pin CDIP Tube |
|
Texas Instruments | Logic and Timing Misc | No | 28 | CDIP | DIP | No | Yes | No | No | No | EAR99 | Yes | Yes | ||
5962-9467201QXA Scan Test Device -55°C to 125°C 68-Pin CFPAK Tube |
|
Texas Instruments | Logic and Timing Misc | No | 68 | CFPAK | FPAK | No | Yes | No | No | No | EAR99 | No | |||
5962-9681101QXA Scan Test Device -55°C to 125°C 68-Pin CFPAK Tube |
|
Texas Instruments | Logic and Timing Misc | No | 68 | CFPAK | FPAK | No | Yes | No | No | No | EAR99 | No | |||
5962-9172701QLA Scan Test Device -55°C to 125°C 24-Pin CDIP Tube |
|
Texas Instruments | Logic and Timing Misc | No | 24 | CDIP | DIP | No | Yes | No | No | No | EAR99 | Yes | Yes | ||
5962-9172501MLA Scan Test Device -55°C to 125°C 24-Pin CDIP Tube |
|
Texas Instruments | Logic and Timing Misc | No | 24 | CDIP | DIP | No | Yes | No | No | No | EAR99 | Yes | Yes | ||
5962-9172601MLA Scan Test Device -55°C to 125°C 24-Pin CDIP Tube |
|
Texas Instruments | Logic and Timing Misc | No | 24 | CDIP | DIP | No | Yes | No | No | No | EAR99 | Yes | Yes | ||
74ABTH182502APMG4 Scan Test Device |
|
Texas Instruments | Logic and Timing Misc | 64 | LQFP | QFP | No | No | No | No | No | EAR99 | Yes | No | |||
74LVTH18512DGGRE4 Scan Test Device -40°C to 85°C 64-Pin TSSOP T/R |
|
Texas Instruments | Logic and Timing Misc | 64 | TSSOP | SO | No | No | No | No | No | EAR99 | Yes | No | |||
5962-9681201Q3A Addressable Scan Port -55°C 125°C 28-Pin CLLCC Tube |
|
Texas Instruments | Logic and Timing Misc | No | 28 | CLLCC | LCC | No | Yes | No | No | No | No | ||||
74ABTH182504APMG4 Scan Test Device |
|
Texas Instruments | Logic and Timing Misc | 64 | LQFP | QFP | No | No | No | No | No | Yes | No | ||||
74ABTH182646APMG4 Scan Test Device |
|
Texas Instruments | Logic and Timing Misc | 64 | LQFP | QFP | No | No | No | No | No | EAR99 | Yes | No | |||
74LVTH182652APMG4 Scan Test Device |
|
Texas Instruments | Logic and Timing Misc | 64 | LQFP | QFP | No | No | No | No | No | EAR99 | Yes | No | |||
74LVT18512DGGRE4 Scan Test Device |
|
Texas Instruments | Logic and Timing Misc | 64 | TSSOP | SO | No | No | No | No | No | Yes | No | ||||
74LVTH18514DGGRG4 Scan Test Device |
|
Texas Instruments | Logic and Timing Misc | 64 | TSSOP | SO | No | No | No | No | No | EAR99 | Yes | No | |||
74LVTH182504APMG4 Scan Test Device -40°C to 85°C 64-Pin LQFP Tray |
|
Texas Instruments | Logic and Timing Misc | No | 64 | LQFP | QFP | No | Unknown | No | No | No | No | EAR99 | Yes | No | |
74ABT18245ADGGRE4 Scan Test Device |
|
Texas Instruments | Logic and Timing Misc | 56 | TSSOP | SO | No | No | No | No | No | Yes | No | ||||
74ABT18245ADGGRG4 Scan Test Device |
|
Texas Instruments | Logic and Timing Misc | 56 | TSSOP | SO | No | No | No | No | No | EAR99 | Yes | No | |||
74LVT18512DGGRG4 Scan Test Device |
|
Texas Instruments | Logic and Timing Misc | 64 | TSSOP | SO | No | No | No | No | No | Yes | No |